How to Simulate

Simulating Test in Testbag is very Easy

All Test are classified Main Category wise. Each main category represents a group of exams.

For example

Medical Entrance Exams
Engineering Entrance Exams
UPSC Exams
Hotel Management Exams and so on

Each Main Category will be further classified into categories. Each category represents Institute / Board conducting the exam or Exam types . For example

Main Category Category
Medical Entrance Exams All India Institute of Medical Science Ent. Exam
Armed Force Medical College entrance Exam
Banaras Hindu University Entrance Exam and so on
Engineering Entrance Exam Central Board of Secondary Education Exams
Andhra Pradesh State Council of Higher Education
Birla Institute of Technology and so on
UPSC Exams Civil Services (Preliminary) Examinations
VITEEE Exams and so on
Each category is further classified into subcategories. Each subcategory represent specific exam within the category. For example
Category Subcategory
Central Board of Secondary Education Exams All India Engineering/Architecture Examination
Civil Services (Preliminary) Examinations Civil Services (Preliminary) Examinations General Studies
Civil Services (Preliminary) Examinations Botany

Each subcategory is further classified into Model Test Category. Each Test
Category represents subject wise model tests. For example
Subcategory Model Test Category
All India Engineering/Architecture Examination AIEEE Physics Model Tests
AIEEE Chemistry Model Tests
AIEEE Maths Model Tests

Each Test Category is further classified into Model Test Patterns. Each
Test Pattern is classified either year wise or number wise. The year represents the
Memory based model test pattern for exam in said year . If model test pattern is number
wise it represents a pattern created by experts keeping previous years patterns in view.
For example
Model Test Category Model Test Pattern
AIEEE Physics Tests AIEEE 2007
AIEEE 1


In this case AIEEE PHYSICS 2007 represents memory based model test pattern for
AIEEE PHYSICS exam in year 2007 and AIEEE 2007 1 represents Test pattern
created by experts

Each Test Pattern is detailed as per pattern of said exam to the level

Number of questions in exam
Number of questions per page
Total time for test
Marks for correct answer
Marks for incorrect answer
Marks for questions not attempted
Topics/subtopics from where the question were included in the said exam
Number of questions each topic wise
Difficulty level each topic wise/subtopic wise
Question types whether multiple choice, multiple response, fill in blanks, true false

For example in Test Pattern AIEEE PHYSICS 2007 details are as under
Number of questions in exam 40
Number of questions per page 20
Total time for test (in minutes) 60
Marks for correct answer 3.0
Marks for incorrect answers -1.0
Marks for questions not attempted Nil
Topics (Chapter wise) Number of Question
Level of Difficulty
Question types

Motion in One Dimension
1
medium
multiple choice
Motion in two Dimension
1
medium
multiple choice
Laws of Motion
1
medium
multiple choice
Work, Energy and Power
1
medium
multiple choice
Rotational Motion and Dynamics
4
medium
multiple choice
Heat
2
medium
multiple choice
Thermodynamics
2
medium
multiple choice
Oscillations
4
medium
multiple choice
Waves
1
medium
multiple choice
Electrostatics
5
medium
multiple choice
Current Electricity
2
medium
multiple choice
Magnetic Effects of Current
5
medium
multiple choice
Electromagnetic Induction
1
medium
multiple choice
Alternating current
1
medium
multiple choice
Ray Optics
1
medium
multiple choice
Wave Optics
1
medium
multiple choice
Atom Nuclei and Molecules
3
medium
multiple choice
Dual Nature of Radiation
2
medium
multiple choice
Solids and semiconductors
2
medium
multiple choice
TOTAL QUESTIONS
40
   
 
Every time on starting test, a new test on the said pattern with different sets of
questions but on same topics will be available for users to practice. The test will
have specific time and marks as defined in the pattern
 


 

 
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